The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 28, 2017
Filed:
Aug. 13, 2013
Hitachi Systems, Ltd., Shinagawa-ku, Tokyo, JP;
Toru Kono, Tokyo, JP;
Yoshihito Narita, Tokyo, JP;
Kentarou Oonishi, Tokyo, JP;
Minoru Kaneko, Tokyo, JP;
Daisuke Katsumata, Tokyo, JP;
Hitachi Systems, Ltd., Shinagawa-ku, Tokyo, JP;
Abstract
A photovoltaic inspection system is provided, the photovoltaic inspection system detecting a failure by eliminating ON/OFF operation of a switch or others at the time of inspection or checkup as much as possible, reducing an influence of a temperature distribution as a whole with a small effort, and detecting a local deterioration in a photovoltaic module or string. According to a typical embodiment, in a photovoltaic system having a plurality of photovoltaic strings formed of one or a plurality of photovoltaic modules arranged to be aligned, a photovoltaic inspection system which detects the failure in the photovoltaic strings includes: a current detector which measures each of a first output current of a first photovoltaic string and a second output current of a second photovoltaic string; and a monitoring unit which calculates a second temperature property of the second photovoltaic string based on a value of the first output current and a value of the second output current and which determines whether the second photovoltaic string has the failure or not based on the second temperature property.