The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 28, 2017

Filed:

Apr. 29, 2015
Applicant:

Sumitomo Electric Industries, Ltd., Osaka-shi, JP;

Inventor:

Mitsuhiko Sakai, Osaka, JP;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/00 (2006.01); H01L 21/78 (2006.01); H01L 21/304 (2006.01); H01L 21/283 (2006.01); H01L 21/268 (2006.01); H01L 29/06 (2006.01);
U.S. Cl.
CPC ...
H01L 21/78 (2013.01); H01L 21/268 (2013.01); H01L 21/283 (2013.01); H01L 21/304 (2013.01); H01L 29/0657 (2013.01);
Abstract

A method of manufacturing a semiconductor device includes the steps of preparing a semiconductor substrate including a semiconductor layer having a first main surface and a second main surface located opposite to the first main surface and an epitaxial layer formed on the first main surface, forming a trench having a sidewall passing through the epitaxial layer and reaching the semiconductor layer and a bottom portion continuing to the sidewall and located in the semiconductor layer, decreasing a thickness of the semiconductor layer by grinding the second main surface, forming an electrode layer on the ground second main surface, achieving ohmic contact between the second main surface and the electrode layer by laser annealing, and obtaining individual substrates by forming a cutting portion along the trench and dividing the semiconductor substrate along the cutting portion.


Find Patent Forward Citations

Loading…