The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 28, 2017

Filed:

Mar. 25, 2015
Applicant:

Sumitomo Electric Industries, Ltd., Osaka-shi, JP;

Inventors:

Ryosuke Kubota, Osaka, JP;

Ren Kimura, Osaka, JP;

So Tanaka, Osaka, JP;

Kazuhito Kobashi, Hitachinaka, JP;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/265 (2006.01); H01L 21/02 (2006.01); H01L 21/027 (2006.01); H01L 21/3065 (2006.01); H01L 21/324 (2006.01); H01L 21/67 (2006.01); H01L 21/683 (2006.01); H01L 23/00 (2006.01); H01L 29/66 (2006.01); H01L 21/04 (2006.01); H01L 29/16 (2006.01); H01L 29/04 (2006.01);
U.S. Cl.
CPC ...
H01L 21/02027 (2013.01); H01L 21/027 (2013.01); H01L 21/3065 (2013.01); H01L 21/324 (2013.01); H01L 21/67103 (2013.01); H01L 21/6831 (2013.01); H01L 21/6833 (2013.01); H01L 21/6838 (2013.01); H01L 23/562 (2013.01); H01L 29/66068 (2013.01); H01L 21/046 (2013.01); H01L 29/045 (2013.01); H01L 29/1608 (2013.01);
Abstract

A method for manufacturing a semiconductor device includes a step of preparing a SiC substrate, a step of fixing the SiC substrate on an electrostatic chuck and heat-treating the SiC substrate, and a step of performing ion implantation treatment on the SiC substrate fixed on the electrostatic chuck and heat-treated. The step of heat-treating includes an outer circumferential-side chucking step which generates an electrostatic attraction force between an outer circumferential region of the SiC substrate and an outer circumferential portion of the electrostatic chuck, the outer circumferential portion facing the outer circumferential region, and an inner circumferential-side chucking step which is started after the outer circumferential-side chucking step is started, and generates an electrostatic attraction force between an inner circumferential region of the SiC substrate and an inner circumferential portion of the electrostatic chuck, the inner circumferential portion facing the inner circumferential region.


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