The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 28, 2017
Filed:
Apr. 20, 2015
Applicant:
Samsung Electronics Co., Ltd., Suwon-si, KR;
Inventors:
Seokjoong Hwang, Seoul, KR;
Youngsam Shin, Hwaseong-si, KR;
Wonjong Lee, Seoul, KR;
Jaedon Lee, Yongin-si, KR;
Assignee:
SAMSUNG ELECTRONICS CO., LTD., Suwon-si, Gyeonggi-Do, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 15/40 (2011.01); G06T 15/06 (2011.01);
U.S. Cl.
CPC ...
G06T 15/06 (2013.01);
Abstract
A method and apparatus to perform a ray-node intersection test are provided. The method includes receiving an input representing coordinates of a bounding box and an origin coordinate of a ray as fixed-point numbers, obtaining difference values between the input coordinates of the bounding box and the origin coordinate, and obtaining multiplication values between the obtained difference values and a reciprocal number of a direction vector of the ray, where the reciprocal number is a floating-point number.