The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 28, 2017
Filed:
Aug. 14, 2013
Siemens Aktiengesellschaft, Munich, DE;
Frank Dennerlein, Forchheim, DE;
Mathias Hoernig, Erlangen, DE;
SIEMENS AKTIENGESELLSCHAFT, Munich, DE;
Abstract
A method for determining at least one three-dimensional image data record of a target area from two sets of projection images recorded with x-ray spectra using different energy maxima. A first set of projection images is recorded via a first X-ray spectrum and different first projection directions and a second set of projection images via a second X-ray spectrum and different second projection directions which differ at least partially from the first projection directions. A three-dimensional anatomy image data record is reconstructed from the first and the second projection images. A three-dimensional spectral image data record is reconstructed by a weighted combination of a first three-dimensional reconstruction image data record reconstructed from the first projection images, and a second three-dimensional reconstruction image data record reconstructed from the second projection images. The anatomy image data record and the spectral image data record are displayed.