The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 28, 2017
Filed:
Jun. 12, 2009
Farhang Kassaei, San Jose, CA (US);
Amanda A. Earhart, Santa Cruz, CA (US);
Snezana Sahter, San Jose, CA (US);
Srinivasu Gottipati, Fremont, CA (US);
Lars Wright, Campbell, CA (US);
Craig Rowley, San Jose, CA (US);
Lakshman Shyam Sundar Maddali, Sunnyvale, CA (US);
Nainesh Nayudu, San Jose, CA (US);
Farhang Kassaei, San Jose, CA (US);
Amanda A. Earhart, Santa Cruz, CA (US);
Snezana Sahter, San Jose, CA (US);
Srinivasu Gottipati, Fremont, CA (US);
Lars Wright, Campbell, CA (US);
Craig Rowley, San Jose, CA (US);
Lakshman Shyam Sundar Maddali, Sunnyvale, CA (US);
Nainesh Nayudu, San Jose, CA (US);
eBay Inc., San Jose, CA (US);
Abstract
In various exemplary embodiments, a system and associated method to perform an adaptive risk-based assessment of a user is disclosed. The method includes assigning a risk assessment process to the user and providing a plurality of assessment factors to the risk assessment process. The plurality of assessment factors are based on both the user (e.g., previously assessed factors, residence, phone number, address, etc.) and one or more actions the user may perform (e.g., selling an item in an electronic marketplace and the value of the item). A post-action analysis of the risk assessment process is performed. The risk assessment process can be modified based on a determination of the post-action analysis.