The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 28, 2017
Filed:
Aug. 22, 2014
Applicant:
Matrox Electronic Systems Ltd., Dorval, CA;
Inventor:
Arnaud Lina, Montreal, CA;
Assignee:
MATROX ELECTRONIC SYSTEMS LTD., Dorval, Quebec, CA;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2006.01); G06K 9/34 (2006.01); G06K 9/42 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G06K 9/6215 (2013.01); G06K 9/34 (2013.01); G06K 9/42 (2013.01); G06T 7/0065 (2013.01); G06T 7/0095 (2013.01); G06T 2207/20048 (2013.01); G06T 2207/20112 (2013.01);
Abstract
There is described herein a method and system for detecting, in a segmented image, the presence and position of objects with a dimension greater than or equal to a minimum dimension. The objects exhibit a property whereby a distance map of the object at a first scale and a distance map of the object at a second scale greater than the first scale differ by a constant value over a domain of the distance map of the object at the first scale. A distance map of a model object is compared to a distance map of a target object using a similarity score that is invariant to an offset.