The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 28, 2017

Filed:

Dec. 27, 2013
Applicant:

Weyerhaeuser Nr Company, Federal Way, WA (US);

Inventors:

Zhenkui Ma, Kent, WA (US);

Yuzhen Li, Shoreline, WA (US);

Assignee:

Weyerhaeuser NR Company, Seattle, WA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/46 (2006.01); G06K 9/00 (2006.01); G01N 21/17 (2006.01);
U.S. Cl.
CPC ...
G06K 9/00657 (2013.01); G01N 21/17 (2013.01); G01N 2021/1797 (2013.01);
Abstract

A system for analyzing remotely sensed photos of a forest or other areas of interest uses a computer system to increase the variation in NIR data having values that represent items of interest. In one embodiment, a computer system applies a stretching function to the NIR data to increase their variation. The objective spectral stretched NIR data is used to differentiate different types of vegetation in the remotely sensed image. Objective-based Vegetation Index (OVI) values are calculated from the objective spectral stretched NIR data that allow different types of vegetation to be distinguished. In one embodiment, the OVI values are used to differentiate hardwoods from conifers in a digital aerial photo of a forest.


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