The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 28, 2017
Filed:
Feb. 18, 2016
Institute for Information Industry, Taipei, TW;
Chien-Ting Kuo, Taichung, TW;
Shih-Jen Chen, New Taipei, TW;
INSTITUTE FOR INFORMATION INDUSTRY, Taipei, TW;
Abstract
A software test method used in a software test system that includes a memory that stores a plurality of computer executable instructions and a processing unit coupled to the memory is provided. The software test method includes the steps outlined below. The processing unit detects input and output parameters of under-test software. The processing unit detects inner operation parameters of the under-test software. The processing unit establishes parameter variance probability of each parameter variances between any two functions included in the under-test software to generate test case including test parameters accordingly. The processing unit transmits test parameters of the test case to the under-test software to perform test.