The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 28, 2017
Filed:
Jun. 19, 2015
Emc Corporation, Hopkinton, MA (US);
Sudeep Abraham Mathew, Karnataka, IN;
Krishna Mohan Gudipudi, Karnataka, IN;
EMC IP Holding Company LLC, Hopkinton, MA (US);
Abstract
Described are methods, systems, and apparatus, including computer program products for analyzing system dumps. A method for analyzing a first system dump is performed by a computing system. The first system dump is received by the computing system, the first system dump generated by a first server in response to the first server detecting a first error. First diagnostic data are extracted, by the computing system, from the first system dump, the first diagnostic data comprising at least first call stack data for the first server. Second diagnostic data are identified by the computing system that are indicative of the first error by comparing the first call stack data of the first diagnostic data to second call stack data of the second diagnostic data.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile