The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 28, 2017

Filed:

Jun. 12, 2014
Applicant:

Vmware, Inc., Palo Alto, CA (US);

Inventors:

Junwei Li, Atanta, GA (US);

Jay A. Patel, Mountain View, CA (US);

Assignee:

VMware, Inc., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/48 (2006.01); G06F 9/50 (2006.01); G06F 11/30 (2006.01); G06F 11/34 (2006.01);
U.S. Cl.
CPC ...
G06F 9/5011 (2013.01); G06F 9/4881 (2013.01); G06F 11/30 (2013.01); G06F 11/3006 (2013.01); G06F 11/3072 (2013.01); G06F 11/3409 (2013.01); G06F 11/3452 (2013.01);
Abstract

This disclosure is directed to methods and systems for calculating statistical quantities of computational resources used by distributed data sources in a computing environment. In one aspect, a master node receives a query regarding use of computational resources used by distributed data sources of a computing environment. The data sources generate metric data that represents use of the computational resources and distribute the metric data to two or more worker nodes. The master node directs each worker node to generate worker-node data that represents the metric data received by each of the worker nodes and each worker node sends worker-node data to the master node. The master node receives the worker-node data and calculates a master-data structure based on the worker-node data, which may be used to estimate percentiles of the metric data in response to the query.


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