The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 28, 2017
Filed:
Nov. 12, 2014
Applicant:
Olympus Corporation, Tokyo, JP;
Inventor:
Masashi Okabe, Hachioji, JP;
Assignee:
OLYMPUS CORPORATION, Tokyo, JP;
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01); G02B 21/36 (2006.01); G01J 3/00 (2006.01); H04N 5/205 (2006.01); G06T 5/00 (2006.01); G01J 3/02 (2006.01); G01J 3/28 (2006.01);
U.S. Cl.
CPC ...
G02B 21/365 (2013.01); G01J 3/00 (2013.01); G01J 3/027 (2013.01); G06T 5/009 (2013.01); H04N 5/205 (2013.01); G01J 2003/2826 (2013.01); G06T 2207/10024 (2013.01); G06T 2207/10056 (2013.01);
Abstract
Provided is a microscope system including a microscope provided with a multi-channel image-acquisition unit that acquires images of a specimen at respective wavelengths; an adjustment-method storage portion that stores, for respective channels, contrast adjusting methods for the images acquired by the image-acquisition unit; and a contrast adjusting portion that adjusts, for the respective channels, contrasts of the images acquired by the image-acquisition unit based on the contrast adjusting methods stored in the adjustment-method storage portion.