The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 28, 2017
Filed:
Sep. 10, 2014
Keyence Corporation, Osaka, JP;
Woobum Kang, Osaka, JP;
Keyence Corporation, Osaka, JP;
Abstract
To provide a microscopic imaging device in which a measuring object can be easily imaged using measurement light having a desired pattern, in which the pattern of measurement light can be changed and a phase of the pattern can be moved, without arranging a mechanical mechanism. An arbitrary pattern of a plurality of patterns of measurement light is instructed. The measurement light having an instructed pattern is generated by a light modulation element, and is applied on a measuring object. A spatial phase of the generated pattern is sequentially moved on the measuring object by a predetermined amount by the light modulation element. A plurality of pieces of pattern image data generated at a plurality of phases of the pattern is synthesized based on the light receiving signal output from the light receiving section to generate sectioning image data indicating an image of the measuring object.