The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 28, 2017
Filed:
Jan. 07, 2013
Applicant:
Ihs Global Inc., Englewood, CO (US);
Inventors:
Yingwei Yu, Katy, TX (US);
Clifford L. Kelley, Sugar Land, TX (US);
Irina M. Mardanova, Houston, TX (US);
Assignee:
IHS Global, Inc., Englewood, CO (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 1/00 (2006.01); G01V 1/30 (2006.01); G01V 1/28 (2006.01); G01V 1/34 (2006.01); G01V 1/36 (2006.01);
U.S. Cl.
CPC ...
G01V 1/301 (2013.01); G01V 1/288 (2013.01); G01V 1/34 (2013.01); G01V 1/364 (2013.01); G01V 2210/63 (2013.01);
Abstract
A symmetry attribute is described that may be used for determining seismic stratigraphic features in a formation. In one example, seismic input data from a formation is processed to determine an attribute by selecting a center trace, assigning a first cluster of the traces to a left image and a second cluster of the traces to a right image, and determining symmetry about the center trace between the left and the right images.