The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 28, 2017
Filed:
Jul. 09, 2013
Siemens Aktiengesellschaft, Munich, DE;
Edgar Göderer, Forchheim, DE;
Peter Hackenschmied, Nuremberg, DE;
Steffen Kappler, Effeltrich, DE;
Björn Kreisler, Hausen, DE;
Miguel Labayen De Inza, Forchheim, DE;
Daniel Niederlöhner, Erlangen, DE;
Mario Reinwand, Breitbrunn, DE;
Christian Schröter, Bamberg, DE;
Matthias Strassburg, Klangenfurt, AT;
Stefan Wirth, Erlangen, DE;
SIEMENS AKTIENGESELLSCHAFT, Munich, DE;
Abstract
A method is disclosed for detecting x-rays using an x-ray detector which includes a direct-conversion semiconductor detector element. Additional radiation is supplied to the semiconductor detector element using a radiation source, and the supply of the additional radiation is controlled and/or regulated on the basis of a specified target value. In at least one embodiment, the target value can be specified in a variable manner over time as a sequence of target values. An x-ray detector system is further disclosed, with which the method can be carried out.