The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 28, 2017

Filed:

May. 12, 2015
Applicant:

Microchip Technology Incorporated, Chandler, AZ (US);

Inventor:

Lynn Russell Kern, Tucson, AZ (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 27/08 (2006.01); G01R 21/00 (2006.01); G01R 31/42 (2006.01); G01R 19/165 (2006.01); G01R 31/40 (2014.01);
U.S. Cl.
CPC ...
G01R 31/42 (2013.01); G01R 19/16547 (2013.01); G01R 31/40 (2013.01);
Abstract

A power monitoring circuit and method for detecting deviations in the output of a power supply. The power monitor is configured to detect and measure two different types of deviations: transient deviations short surges or spikes in the current drawn by the device being powered and prolonged deviations over a threshold current that may be intentional, temporary increases in the output of the power supply. The power monitor collects information such as the number of each type of deviation, the duration of each deviation and the peak current describing identified deviations. This collected information can then be used, especially during the development phase, to locate the root cause of the deviation. The components of the power monitor used to detect and measure these deviations may be disabled and enabled as needed.


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