The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 28, 2017

Filed:

Mar. 18, 2014
Applicant:

Panasonic Corporation, Osaka, JP;

Inventors:

Zhiqiang Wei, Osaka, JP;

Takeki Ninomiya, Osaka, JP;

Shunsaku Muraoka, Osaka, JP;

Takeshi Takagi, Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/00 (2006.01); G11C 11/00 (2006.01); G01R 27/02 (2006.01); G11C 13/00 (2006.01); G11C 29/50 (2006.01);
U.S. Cl.
CPC ...
G01R 27/02 (2013.01); G11C 13/0002 (2013.01); G11C 13/004 (2013.01); G11C 13/0007 (2013.01); G11C 13/0069 (2013.01); G11C 29/50 (2013.01); G11C 13/00 (2013.01); G11C 2013/0073 (2013.01); G11C 2029/5002 (2013.01);
Abstract

An estimation method for a variable resistance element including (i) a first electrode, (ii) a second electrode, and therebetween (iii) a variable resistance layer in which a local region is formed which has resistive status that reversibly changes according to an electric pulse applied between the first electrode and the second electrode, the estimation method including: obtaining, when changes are made to the resistive status of the local region, measurement values each indicating a resistance state after one of the changes; and determining, based on a distribution of the obtained measurement values, an estimated amount of a physical parameter regarding structural characteristics of the local region by a calculation.


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