The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 28, 2017

Filed:

May. 22, 2014
Applicant:

Lockheed Martin Corporation, Bethesda, MD (US);

Inventors:

Richard M. Hall, Orlando, FL (US);

Sreerupa Das, Oviedo, FL (US);

Assignee:

Lockheed Martin Corporation, Bethesda, MD (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01P 3/00 (2006.01); G01P 3/64 (2006.01); G06F 17/14 (2006.01); G01P 3/48 (2006.01); G01P 3/489 (2006.01); G01M 7/02 (2006.01);
U.S. Cl.
CPC ...
G01P 3/64 (2013.01); G01M 7/025 (2013.01); G01P 3/48 (2013.01); G01P 3/489 (2013.01); G06F 17/142 (2013.01);
Abstract

Deriving a clean timing signal from a waveform is disclosed. A sensor-of-interest (SOI) sample set and a waveform sample set that correspond to the SOI sample set in time is collected. The waveform sample set is partitioned into a plurality of waveform sample subsets, and the SOI sample set is partitioned into a plurality of SOI sample subsets, each SOI sample subset corresponding to one of the plurality of waveform sample subsets. A plurality of waveform sample subset angular speeds is determined, wherein each waveform sample subset angular speed corresponds to a different waveform sample subset. An aggregate mean angular speed based on the plurality of waveform sample subset angular speeds is determined. Each SOI sample subset is resampled to the aggregate mean angular speed based on the corresponding waveform sample subset angular speed to generate a plurality of resampled SOI subsets.


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