The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 28, 2017
Filed:
Sep. 27, 2013
Sysmex Corporation, Kobe-shi, Hyogo, JP;
SYSMEX CORPORATION, Hyogo, JP;
Abstract
A sample analysis system includes a first measurement unit, a second measurement unit arranged to a downstream side of the first measurement unit, and an information processing section which obtains a measurement result of a sample. The information processing section determines, based on the measurement result of the sample measured by the first measurement unit, whether or not a retest of the sample by the first measurement unit is necessary. When the retest by the first measurement unit is necessary, the information processing section causes the sample container to be transported to a first sample supply position for the first measurement unit and causes the first measurement unit to perform measurement of the sample.