The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 28, 2017
Filed:
Dec. 28, 2012
Siemens Aktiengesellschaft, München, DE;
Werner Heinrich, Oberkrämer OT Bärenklau, DE;
Hubert Mooshofer, München, DE;
SIEMENS AKTIENGESELLSCHAFT, , DE;
Abstract
A device and a method for detecting at least one defect in a test object (). At least one test head () radiates an ultrasonic signal at different measuring points (MP) into the test object () with each point at an insonation or radiation angle (α) in order to ascertain multiple measurement data sets (MDS). The angle is constant for each data set (MDS). An analyzing unit () carries out an SAFT (Synthetic Aperture Focusing Technique) analysis for each ascertained measurement data set (MDS) using a common reconstruction grid (RG) inside the test object () in order to calculate an SAFT analysis result for each measurement data set (MDS). The analyzing unit () superimposes the calculated SAFT analysis results in order to calculate an orientation-independent defect display value (S) for each reconstruction point (RP) of the common reconstruction grid (RG).