The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 28, 2017

Filed:

Nov. 26, 2014
Applicant:

Tdk Corporation, Tokyo, JP;

Inventor:

Takashi Urano, Tokyo, JP;

Assignee:

TDK CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 27/26 (2006.01); G01N 27/02 (2006.01); H02J 5/00 (2016.01); H01F 27/40 (2006.01); H01F 38/14 (2006.01); G01V 3/10 (2006.01);
U.S. Cl.
CPC ...
G01N 27/025 (2013.01); H01F 27/402 (2013.01); H01F 38/14 (2013.01); H02J 5/005 (2013.01); G01V 3/105 (2013.01);
Abstract

The present invention aims to provide a coil unit for improving an accuracy in detecting foreign matter and an apparatus for detecting foreign matter which improves the accuracy in detecting foreign matter when a power is transmitted in a contactless manner. A power feeding coil unit (a coil unit) of the present invention is provided with a power feeding coil (a coil for power transmission) and an apparatus for detecting foreign matter. The apparatus for detecting foreign matter is provided with a plurality of resonators having a resonator coil and a resonator capacitor and also an excitation coil for exciting the plurality of resonators. The plurality of resonators are disposed to cover at least an area interlinking with a magnetic flux generated by the power feeding coil and to decrease an influence of mutual inductance.


Find Patent Forward Citations

Loading…