The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 28, 2017

Filed:

Feb. 14, 2013
Applicant:

Exfo Inc., Quebec, CA;

Inventors:

Normand Cyr, Quebec, CA;

Hongxin Chen, Chino Hills, CA (US);

Gregory Walter Schinn, Quebec, CA;

Assignee:

EXFO INC, Quebec, CA;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/21 (2006.01); G01M 11/00 (2006.01); G06F 17/18 (2006.01);
U.S. Cl.
CPC ...
G01N 21/21 (2013.01); G01M 11/3163 (2013.01); G01M 11/3181 (2013.01); G01M 11/335 (2013.01); G01M 11/336 (2013.01); G06F 17/18 (2013.01);
Abstract

A polarization-related characteristic of an optical path is determined from a predetermined function of the mean-square of a plurality of differences between polarization-analyzed optical power parameters corresponding to pairs of wavelengths mutually spaced about a midpoint wavelength by a small optical frequency difference. At least some of the said differences correspond to wavelength pairs measured under conditions where at least one of midpoint wavelength, input state of polarization (I-SOP) or analyzed state of polarization (A-SOP) of a pair is different.


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