The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 28, 2017
Filed:
Jun. 18, 2015
Samsung Electronics Co., Ltd., Suwon-si, KR;
Seung Jun Lee, Yongin-si, KR;
Jung Ki Min, Yongin-si, KR;
Seung Hoon Kim, Suwon-si, KR;
Ji Young Park, Seoul, KR;
Hyun-Suk Kang, Suwon-si, KR;
SAMSUNG ELECTRONICS CO., LTD., Suwon-si, KR;
Abstract
Provided is a fluid analysis cartridge configured to analyze a fluid specimen, a fluid analysis sheet forming the same and a method of manufacturing the fluid analysis cartridge. The fluid analysis sheet includes at least one cut out part configured to form an intermediate layer of an inspection substrate, the cut out part including a flow passage structure including an inlet part in which a fluid is introduced and an inspection part in which the fluid is introduced to react with a reagent; and wherein the cut out part is further configured to include a first end adjacent to the inspection part and a second end adjacent to the inlet part, and wherein a minimum distance between the first end and the flow passage structure is at least 1 mm.