The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 28, 2017
Filed:
May. 15, 2014
Snecma, Paris, FR;
Jean Vincent Manuel Meriaux, Moissy-Cramayel, FR;
Guillaume Puech, Moissy-Cramayel, FR;
Juan-Antonio Ruiz-Sabariego, Moissy-Cramayel, FR;
Nathalie Serres, Moissy-Cramayel, FR;
SNECMA, Paris, FR;
Abstract
A method for optimizing a low cycle and optionally high-cycle fatigue test rig includes selecting variable geometric parameters of the support member and/or of the workpiece of the rig, in addition to ranges of variation of these parameters, selecting at least one aim or design objective to be achieved, a variation in the values of at least a part of the abovementioned parameters having an influence on this aim or design objective, and testing one or a plurality of the values of the abovementioned parameters, in the respective ranges of same, and determining those values that make it possible to achieve the aim or design objection. With those values, the method including producing or modifying a support member and/or a workpiece on the basis of the optimized parameters.