The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 28, 2017
Filed:
Oct. 15, 2015
Samsung Electronics Co., Ltd., Suwon-si, KR;
Massachusetts Institute of Technology, Cambridge, MA (US);
Chan-Wook Baik, Yongin-si, KR;
Ogan Gurel, Seongnam-si, KR;
Benjamin Kwasi Ofori-Okai, Cambridge, MA (US);
Christopher Alan Werley, Cambridge, MA (US);
Keith Adam Nelson, Newton, MA (US);
Stephanie Meng-Yan Teo, Cambridge, MA (US);
SAMSUNG ELECTRONICS CO., LTD., Suwon-si, KR;
MASSACHUSETTS INSTITUTE OF TECHNOLOGY, Cambridge, MA (US);
Abstract
A two-dimensional (2D) spectroscopy system and a 2D spectroscopic analysis method are disclosed. The 2D spectroscopy system includes: a light transmission delayer configured for forming a plurality of first light pulses from first light pulse and causing a relative time delay therebetween; a response pulse wave generator configured for generating a plurality of response pulse waves responds and having a relative time delay, and for irradiating the plurality of response pulse waves on the sample; an optical readout pulse array generator configured for forming an optical readout pulse array by splitting the second light pulse into a plurality of regions having different time delays and spatially discriminated from one another; and a reader configured for reading out by overlapping the optical readout pulse array with a signal generated from the sample.