The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 28, 2017

Filed:

Jul. 22, 2013
Applicant:

Lanzhou Haimo Technologies, Co. Ltd., Gansu, CN;

Inventor:

Jige Chen, Gansu, CN;

Assignee:

HAIMO TECHNOLOGIES GROUP CORP., Lanzhou, Gansu, CN;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01F 1/74 (2006.01); G01F 1/44 (2006.01); G01F 5/00 (2006.01);
U.S. Cl.
CPC ...
G01F 1/74 (2013.01); G01F 1/44 (2013.01); G01F 5/00 (2013.01);
Abstract

A flow metering method for an annular gas and liquid flow comprises the following steps of: first, enabling a gas and liquid mixed fluid to flow through a vertically arranged circular pipe so as to form the annular gas and liquid flow; and then measuring total flow or liquid average velocity or gas average velocity of the gas and liquid mixed fluid; measuring physical quantities, such as temperature, pressure, gas fraction and the like, of the gas and liquid mixed fluid; and finally, accurately figuring out liquid volume flow and gas volume flow according to analysis of a gas and liquid slip factor.


Find Patent Forward Citations

Chen, Jige. (2017). Method for accurately measuring gas flow and liquid flow in a gas and liquid mixed fluid (U.S. Patent No. 9829361). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9829361

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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