The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 28, 2017
Filed:
Feb. 06, 2013
Mitsubishi Materials Corporation, Tokyo, JP;
Hitachi Metals Mmc Superalloy, Ltd., Okegawa-shi, JP;
Masato Itoh, Okegawa, JP;
Kenichi Yaguchi, Okegawa, JP;
Tadashi Fukuda, Kitamoto, JP;
Takanori Matsui, Kitamoto, JP;
Hitachi Metals MMC Superalloy, Ltd., Okegawa-shi, JP;
Abstract
In a Ni-base alloy, an area-equivalent diameter D is calculated. D is defined by D=Afrom an area A of a largest nitride in a field of view when an observation area Sis observed. This process is repeated in n fields of view for measurement, where n is the number of the fields of view for measurement, so as to acquire n pieces of data on D, and the pieces are arranged in ascending order D, D, . . . , Dto obtain a reduced variate y. The obtained values are plotted on X-Y axis coordinates, where an X axis corresponds to D and a Y axis corresponds to y. In a regression line y=a×D+b, yis obtained when a target cross-sectional area S is set to 100 mm. When the obtained yis substituted into the regression line, the estimated nitride maximum size is ≦25 μm in diameter.