The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 28, 2017

Filed:

Feb. 09, 2016
Applicant:

Lapis Semiconductor Co., Ltd., Kanagawa, JP;

Inventor:

Kentaro Toda, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B60S 1/08 (2006.01); G01N 29/14 (2006.01); G05B 19/00 (2006.01); B60S 1/34 (2006.01);
U.S. Cl.
CPC ...
B60S 1/0807 (2013.01); G01N 29/14 (2013.01); G05B 19/00 (2013.01); B60S 1/0818 (2013.01); B60S 1/0859 (2013.01); B60S 1/3411 (2013.01);
Abstract

A semiconductor device including an abnormality detection section that detects an abnormality occurring in a moving body that moves along a specific path on a surface of a specific object; a position detection section that detects a position of the moving body as an abnormality occurrence position, in a case in which the abnormality detection section has detected an abnormality, and that stores abnormality occurrence position information expressing the abnormality occurrence position in a storage section; and a moving body controller that controls an adjusting section to adjust at least one of a force with which the moving body presses against the specific object, or a position of the moving body in a direction intersecting the surface of the specific object, based on a detection result detected by the abnormality detection section and the abnormality occurrence position information.


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