The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 28, 2017
Filed:
Mar. 05, 2013
Applicant:
University of Rochester, Rochester, NY (US);
Inventors:
Ruola Ning, Rochester, NY (US);
Weixing Cai, Rochester, NY (US);
Assignee:
University of Rochester, Rochester, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/03 (2006.01); A61B 6/00 (2006.01); G06T 11/00 (2006.01);
U.S. Cl.
CPC ...
A61B 6/484 (2013.01); A61B 6/03 (2013.01); A61B 6/032 (2013.01); A61B 6/4085 (2013.01); A61B 6/4291 (2013.01); A61B 6/466 (2013.01); A61B 6/502 (2013.01); A61B 6/5205 (2013.01); G06T 11/006 (2013.01); A61B 6/4035 (2013.01);
Abstract
A raw DPC (differential phase contrast) image of an object is acquired. The background phase distribution due to the non-uniformity of the grating system is acquired by the same process without an object in place, and the true DPC image of the object is acquired by subtracting the background phase distribution from the raw DPC image.