The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 28, 2017

Filed:

Aug. 28, 2015
Applicant:

Juergen Marx, Koblenz, DE;

Inventors:

Heinrich Alexander Eberl, Immenstadt, DE;

Juergen Marx, Koblenz, DE;

Assignee:

Juergen Marx, Koblenz, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 5/103 (2006.01); G01S 17/89 (2006.01); G01N 21/3563 (2014.01); A61B 5/1172 (2016.01); A61B 5/1455 (2006.01); A61B 5/00 (2006.01); G01B 11/24 (2006.01); G01S 17/02 (2006.01); G01S 17/42 (2006.01); G01S 7/48 (2006.01); H04N 5/33 (2006.01); H04N 5/225 (2006.01); H04N 3/09 (2006.01); G01N 21/47 (2006.01); G01N 21/84 (2006.01); G01S 7/481 (2006.01);
U.S. Cl.
CPC ...
A61B 5/1032 (2013.01); A61B 5/1172 (2013.01); A61B 5/1455 (2013.01); A61B 5/441 (2013.01); A61B 5/6826 (2013.01); G01B 11/24 (2013.01); G01N 21/3563 (2013.01); G01S 7/4802 (2013.01); G01S 17/023 (2013.01); G01S 17/42 (2013.01); G01S 17/89 (2013.01); A61B 2562/0238 (2013.01); A61B 2576/00 (2013.01); G01N 21/4738 (2013.01); G01N 21/8422 (2013.01); G01N 2201/06113 (2013.01); G01N 2201/105 (2013.01); G01N 2201/12 (2013.01); G01S 7/4817 (2013.01); H04N 3/09 (2013.01); H04N 5/2256 (2013.01); H04N 5/33 (2013.01);
Abstract

A method for detecting the surface structure and composition of a sample by means of a scanning unit, in particular for detecting traces, which are induced by contact of the skin of the human body on the surface of an object or absorbed by means of a trace carrier. The sample and the scanning unit are moved in relation to one another. The sample surface is irradiated line-by-line using a light beam or laser beam emitted from the scanning unit. The light beam or laser beam reflected from the sample surface is detected, and a digital image of the topography of the sample surface and the intensity of the reflected light beam or laser beam is generated from deviations of the reflected light beam or laser beam from the emitted light beam or laser beam to illustrate the composition of the sample surface.


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