The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 28, 2017
Filed:
Feb. 09, 2015
Applicant:
Kowa Company, Ltd., Aichi, JP;
Inventors:
Satoshi Shimada, Tokyo, JP;
Takuya Hara, Tokyo, JP;
Assignee:
KOWA COMPANY, LTD., Aichi, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/14 (2006.01); A61B 3/024 (2006.01); A61B 3/00 (2006.01); A61B 3/12 (2006.01);
U.S. Cl.
CPC ...
A61B 3/024 (2013.01); A61B 3/0008 (2013.01); A61B 3/0025 (2013.01); A61B 3/0041 (2013.01); A61B 3/0091 (2013.01); A61B 3/12 (2013.01);
Abstract
In a perimetry to be conducted, designating an inspection region through a region designator, stimuli are presented to regions separated in an up/down direction, an oblique direction and a right/left direction from the inspection region ('the spaced region') in addition to the designated inspection region. At the result, examinees are not able to predict to which of both regions, the inspection region and the spaced region the stimuli are presented, thereby obtaining correct inspection results that do not receive a prediction of the examinees.