The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 28, 2017
Filed:
Dec. 12, 2013
Fujifilm Corporation, Tokyo, JP;
Makoto Kagaya, Ashigarakami-gun, JP;
Masayuki Takahira, Ashigarakami-gun, JP;
Shingo Masuno, Ashigarakami-gun, JP;
Masanobu Uchihara, Ashigarakami-gun, JP;
FUJIFILM Corporation, Tokyo, JP;
Abstract
An endoscope apparatus including: an image pickup device; a detection device that detects whether or not an image region at which a part of an object region is edged along a direction parallel to the scan lines in a state that is different to a case where a plurality of the scan lines are simultaneously exposed exists in a frame image due to differences of exposure timings for each of the scan lines of the image pickup device based on an image feature amount in the frame image that is obtained from the image data for each of the scan lines that is outputted from the image pickup device; and an exposure control device that changes an exposure time of each of the scan lines by the image pickup device simultaneously for all of the scan lines if the detection device detects the image region.