The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 21, 2017
Filed:
Mar. 31, 2014
Applicant:
Canon Kabushiki Kaisha, Tokyo, JP;
Inventor:
Yusuke Nakazato, Tokyo, JP;
Assignee:
CANON KABUSHIKI KAISHA, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 13/02 (2006.01); G01B 11/26 (2006.01); G01B 11/25 (2006.01);
U.S. Cl.
CPC ...
H04N 13/0253 (2013.01); G01B 11/25 (2013.01); G01B 11/26 (2013.01);
Abstract
An image representing reflected light of structured light is acquired, distance information is calculated, from the image, and a measurement line map storing the distance information is generated. The structured light forms a plurality of measurement lines at discrete positions, and the measurement line map is formed as a two-dimensional array in which one dimension includes elements in a number corresponding to a number of the measurement lines, and another dimension includes elements in a number corresponding to a number of pixels of the image in a lengthwise direction of the measurement lines.