The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 21, 2017
Filed:
Jul. 28, 2016
Carl Zeiss Industrielle Messtechnik Gmbh, Oberkochen, DE;
Aksel Goehnermeier, Essingen-Lauterburg, DE;
Philipp Jester, Heidenheim, DE;
Frank Widulle, Neu-Ulm, DE;
CARL ZEISS INDUSTRIELLE MESSTECHNIK GMBH, Oberkochen, DE;
Abstract
A method and a measuring machine for determining dimensional properties of a measurement object each use a workpiece table and a camera having an image sensor and an imaging optics. The imaging optics exhibits aberrations and is configured to be focused on a plurality of different working positions relative to the workpiece table. The aberrations are minimized by using first calibration values provided for a defined working position. A first working distance of the camera relative to a region of interest is determined. Subsequently, the imaging optics is focused, using the first working distance and using second calibration values that represent an image field curvature of the camera, such that the region of interest is substantially brought into a defined working position. Subsequently, the image recording and image evaluation take place to determine measurement values that represent the dimensional properties of the measurement object in the region of interest.