The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 21, 2017
Filed:
Feb. 20, 2014
Seiko Epson Corporation, Tokyo, JP;
Tatsuaki Funamoto, Shiojiri, JP;
SEIKO EPSON CORPORATION, Tokyo, JP;
Abstract
A spectroscopic analysis apparatus includes a light source section having a first light source and second light source that radiate light fluxes, a wavelength tunable interference filter, an imaging section that captures light having passed through the wavelength tunable interference filter to acquire a first spectroscopic image when the object being imaged is irradiated with the light from the first light source and a second spectroscopic image when the object being imaged is irradiated with the light from the second light source, a pixel detector that detects an abnormal pixel in the first spectroscopic image, and a light amount corrector that replaces the amount of light at the abnormal pixel in the first spectroscopic image with the amount of light at a pixel in the second spectroscopic image that is located in the same position as the abnormal pixel.