The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 21, 2017

Filed:

Dec. 16, 2014
Applicant:

Futurewei Technologies, Inc., Plano, TX (US);

Inventors:

Jie Hu, Amhurst, NY (US);

Chang Wen Chen, Amhurst, NY (US);

Dongqing Zhang, Plainsboro, NJ (US);

Hong Heather Yu, Princeton Jct, NJ (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 15/20 (2011.01); H04N 5/76 (2006.01); G06T 3/40 (2006.01); H04N 5/232 (2006.01); H04N 5/262 (2006.01);
U.S. Cl.
CPC ...
G06T 15/205 (2013.01); G06T 3/40 (2013.01); H04N 5/23238 (2013.01); H04N 5/2628 (2013.01); H04N 5/76 (2013.01);
Abstract

A method and system is proposed to create a generative model to interpolate any view of a planar scene given a sequence of reference views and a synthesis view that is optimized by the marginalization of photometric regulation, and geometric registration parameters. According to one aspect of the claimed subject matter, a technique is proposed to combine information from varying input camera poses. Planar homography based image super resolution in free view interpolation for planar structure is applied to the combined information. Non-redundant information is combined in such a manner that the high resolution and free view problems in traditional 2D based image-based rendering techniques are overcome.


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