The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 21, 2017
Filed:
Jun. 30, 2011
Andrew Litvin, Stoneham, MA (US);
Ram Naidu, Newton, MA (US);
Andrew Litvin, Stoneham, MA (US);
Ram Naidu, Newton, MA (US);
ANALOGIC CORPORATION, Peabody, MA (US);
Abstract
One or more techniques and/or apparatuses described herein provide for reconstructing image data of an object under examination from measured projection data indicative of the object. The measured projection data is converted into image data using an iterative image reconstruction approach. The iterative image reconstruction approach may comprise, among other things, regularizing the image data to adjust a specified quality metric of the image data, identifying regions of the image data that represent aspects of the object that might generate inconsistencies in the measured projection data and correcting the measured projection data based upon such an identification, and/or weighting projections comprised in the measured projection data differently to reduce the influence of projections that respectively have a higher degree of inconsistency in the conversion from projection data to image data.