The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 21, 2017
Filed:
May. 10, 2016
Applicant:
National Sun Yat-sen University, Kaohsiung, TW;
Inventors:
Wei-hung Su, Kaohsiung, TW;
Bo-chin Huang, Kaohsiung, TW;
Assignee:
NATIONAL SUN YAT-SEN UNIVERSITY, Kaohsiung, TW;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 7/00 (2017.01); G01B 11/25 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0057 (2013.01); G01B 11/254 (2013.01); G06T 7/0055 (2013.01); G06T 7/0065 (2013.01);
Abstract
A topographical measurement system of a specular object and a topographical measurement method thereof are disclosed. The topographical measurement system has a screen, an image capturing device, and an image processing device. The specular object reflects a fringe pattern from the screen, so as to form a virtual image of the fringe pattern. The virtual image is therefore analyzed to obtain a surface profile of the specular object.