The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 21, 2017
Filed:
Nov. 20, 2013
Vanderbilt University, Nashville, TN (US);
Anita Mahadevan-Jansen, Nashville, TN (US);
The-Quyen Nguyen, Evanston, IL (US);
Xiaohong Bi, Nashville, TN (US);
Zain Gowani, Nashville, TN (US);
Ginger Holt, Nashville, TN (US);
Isaac Pence, Crestwood, KY (US);
VANDERBILT UNIVERSITY, Nashville, TN (US);
Abstract
In one aspect, the present invention relates to a system evaluating a surgical margin of tumor tissues of a living subject. In one embodiment, the system includes a light source configured to emit a source light; at least one optical probe; a scanner; a spectrometer; and a controller coupled with the scanner and the spectrometer for operably controlling the scanner and the spectrometer. In operation, a working end of the optical probe is positioned proximate to a surface of a specimen of the tumor tissues. A source channel of the optical probe deliver the source light emitted by the light source from the working end to the surface of the specimen, and a plurality of collection channels collect from the working end diffused/reflected light generated from interaction of the source light with the specimen. The spectrometer receives the collected diffused/reflected light to evaluate a margin status of the specimen.