The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 21, 2017

Filed:

Nov. 08, 2012
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Masao Yamanaka, Tokyo, JP;

Masakazu Matsugu, Yokohama, JP;

Yasuo Katano, Kawasaki, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/62 (2006.01); H04N 5/14 (2006.01);
U.S. Cl.
CPC ...
G06K 9/6201 (2013.01); G06K 9/00751 (2013.01); G06K 9/00771 (2013.01); G06K 9/6212 (2013.01); H04N 5/144 (2013.01); H04N 5/147 (2013.01);
Abstract

An event detection apparatus includes an input unit configured to input a plurality of time-sequential images, a first extraction unit configured to extract sets of first image samples according to respective different sample scales from a first time range of the plurality of time-sequential images based on a first scale parameter, a second extraction unit configured to extract sets of second image samples according to respective different sample scales from a second time range of the plurality of time-sequential images based on a second scale parameter, a dissimilarity calculation unit configured to calculate a dissimilarity between the first and second image samples based on the sets of the first and second image samples, and a detection unit configured to detect an event from the plurality of time-sequential images based on the dissimilarity.


Find Patent Forward Citations

Loading…