The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 21, 2017

Filed:

Feb. 17, 2017
Applicant:

L-3 Communications Cincinnati Electronics Corporation, Mason, OH (US);

Inventors:

Harish P. Hiriyannaiah, West Chester, OH (US);

Nansheng Tang, Mason, OH (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 4/00 (2006.01); G01N 21/00 (2006.01); G06K 9/62 (2006.01); G06K 9/20 (2006.01); G06K 9/78 (2006.01); G02B 5/20 (2006.01); G02B 26/00 (2006.01); G02B 27/28 (2006.01);
U.S. Cl.
CPC ...
G06K 9/62 (2013.01); G02B 5/201 (2013.01); G02B 26/008 (2013.01); G02B 27/281 (2013.01); G06K 9/209 (2013.01); G06K 9/2027 (2013.01); G06K 9/78 (2013.01);
Abstract

Systems and methods for characterizing an obscurant and imaging a target are disclosed. In one embodiment, a method of imaging a target includes characterizing at least one obscurant present in an environment, and determining, based on the at least one characterized obscurant, one or more of the following: one or more wavelengths corresponding to the at least one obscurant, a polarization state corresponding to the at least one obscurant, and a sensor exposure time corresponding to the at least one obscurant. The method further includes adjusting one or more parameters of an imagining system based at least in part on a characterization of the at least one obscurant.


Find Patent Forward Citations

Loading…