The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 21, 2017

Filed:

Mar. 28, 2016
Applicant:

Omron Corporation, Kyoto, JP;

Inventors:

Xiang Ruan, Shiga, JP;

Huchuan Lu, Dalian, CN;

Assignee:

OMRON Corporation, Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2006.01); G06K 9/46 (2006.01); G06N 3/04 (2006.01); G06K 9/66 (2006.01);
U.S. Cl.
CPC ...
G06K 9/4676 (2013.01); G06K 9/4628 (2013.01); G06K 9/627 (2013.01); G06K 9/6277 (2013.01); G06K 9/66 (2013.01); G06N 3/0454 (2013.01);
Abstract

A saliency information acquisition device has a local saliency acquisition unit configured to calculate a saliency measure for each pixel in an input image on the basis of information obtained from a local region surrounding each pixel, a candidate-region setting unit configured to set a plurality of candidate regions in the input image, a global saliency acquisition unit configured to calculate a saliency measure for each candidate region in the plurality of candidate regions on the basis of information including a local saliency feature representing an attribute of the saliency measure for each pixel within a candidate region, and a global feature representing an attribute of the candidate regions in relation to the entire input image, and an integration unit configured to combine the saliency measure for each candidate region in the plurality of candidate regions obtained by the global saliency acquisition unit to generate saliency information.


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