The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 21, 2017
Filed:
May. 04, 2016
Bank of America Corporation, Charlotte, NC (US);
John B. Hall, Charlotte, NC (US);
Deborah A. Copes, Wethersfield, CT (US);
Bethany M. Axtell, Ravena, NY (US);
Milton A. Danielson, New Castle, DE (US);
Melody L. Gentile, Newark, DE (US);
Kerry Kurt Simpkins, Fort Mill, SC (US);
BANK OF AMERICA CORPORATION, Charlotte, NC (US);
Abstract
Embodiments of the invention include systems, methods, and computer-program products for generating an overlay of a highlight or mask of a negotiable instrument on a representative's display for keying the instrument. The system overlays and changes the display of a representative's computer screen in real-time for improved keying instruments by generating highlighting or masking of specified portions of the instrument. The invention generates a grid including an X and Y axis on the instrument and identifies the parameter coordinates for the various indicia on the instrument. The invention may contain code for highlighting or masking various indicia on the instrument using the parameter coordinates for mapping. A programmed overlay may be performed on an image of the instrument in real-time as it is queued onto a representative's display. Upon completion of the representative's keying of the instrument, the overlay is removed for storage of the image of the instrument.