The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 21, 2017
Filed:
Jun. 25, 2014
Kodak Alaris Inc., Rochester, NY (US);
James Andrew Whritenor, Mendon, NY (US);
Joseph Anthony Manico, Rochester, NY (US);
Alexander C. Loui, Penfield, NY (US);
KODAK ALARIS INC., Rochester, NY (US);
Abstract
An adaptable eye artifact identification and correction method is disclosed. Eye artifacts are identified and classified based on color, severity, shape, eye location, and cause. Based on this classification, an eye artifact correction algorithm is selected from a series of eye artifact correction techniques. For minor artifacts, simple color correction techniques are deployed to restore the iris color and to drive the pupil to once again appear black. For severe eye artifacts face detection and metadata analysis are utilized to search the user's image collection for recent images of the subject without the eye artifact condition. Once located, these images provide eye color and shape information for use to replace the pixels expressing the eye artifact condition. The non-artifact eye images are used to provide the appropriate eye color and shape to correct the eye artifact condition for more severe eye artifacts.