The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 21, 2017
Filed:
Oct. 29, 2013
Karlsruher Institut Für Technologie (Kit), Karlsruhe, DE;
Acquifer Ag, Karlsruhe, DE;
Urban Liebel, Dielheim-Horrenberg, DE;
Jochen Gehrig, Bretten, DE;
Abstract
The present invention relates to a device and a method for microscopy () of a plurality of samples (), wherein the device comprises:—a first optical detector (), which is designed to consecutively adopt a plurality of measuring positions and to detect first image data () of a sample () with a first spatial resolution at each measuring position;—an image data analyser device which is designed to determine for each sample () a region () of the sample to be examined represented within the first image data () in each case;—a second optical detector (), which is coupled to the first optical detector () in such a manner that the second optical detector () tracks the first optical detector () and therefore the second optical detector () adopts measuring positions which the first optical detector () had previously adopted. The second optical detector () is designed to detect for each sample () respective second image data () from the region () to be examined in the sample () concerned, with a spatial resolution that is higher than the first spatial resolution.