The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 21, 2017

Filed:

Jun. 12, 2015
Applicant:

Fujitsu Limited, Kawasaki-shi, JP;

Inventors:

Atsushi Furuya, Yokohama, JP;

Tadashi Ataka, Kawasaki, JP;

Koichi Shimizu, Inagi, JP;

Assignee:

FUJITSU LIMITED, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01); G01R 33/00 (2006.01);
U.S. Cl.
CPC ...
G06F 17/5018 (2013.01); G01R 33/00 (2013.01); G01R 33/0064 (2013.01); G06F 2217/16 (2013.01);
Abstract

A magnetization analysis apparatus includes a processor configured to execute a process. The process includes: first calculating, using a magnetization vector of each of elements obtained by mesh division in which a magnetic substance is divided into a plurality of meshes and a magnetization vector of an element adjacent to each element, intermediate magnetization that is a magnetization vector at the halfway point between each element and an element adjacent to each element; second calculating an effective magnetic field using the intermediate magnetization calculated at the first calculating; and third calculating a magnetization vector of each element after a unit time based on the effective magnetic field calculated at the second calculating.


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