The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 21, 2017

Filed:

May. 12, 2015
Applicant:

Helic S.a., Athens, GR;

Inventors:

Sotirios Bantas, Athens, GR;

Konstantinos Karouzakis, Athens, GR;

Stefanos Stefanou, Athens, GR;

Apostolos Liapis, Athens, GR;

Labros Kokkalas, Athens, GR;

Konstantinos Nikellis, Athens, GR;

Errikos Lourandakis, Athens, GR;

Assignee:

Helic S.A., Athens, GR;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01); H01F 5/00 (2006.01);
U.S. Cl.
CPC ...
G06F 17/5009 (2013.01); G06F 17/5036 (2013.01); G06F 17/5063 (2013.01); G06F 17/5068 (2013.01); G06F 2217/02 (2013.01); G06F 2217/06 (2013.01); G06F 2217/08 (2013.01); G06F 2217/12 (2013.01); G06F 2217/16 (2013.01); G06F 2217/78 (2013.01); H01F 5/003 (2013.01);
Abstract

A method for designing a circuit element of an integrated circuit (IC) includes receiving one or more desired characteristics of the circuit element from user input and iteratively determining a design solution through one or more simulations and modifications using a rule-set. The one or more desired characteristics are combined with other preset characteristics of the circuit element or the IC. A first model of the circuit element is defined and simulated to calculate performance. The first and subsequent models are modified by drawing on a rule-set of expert knowledge relating to general dependency of at least one design criterion, such as a physical, geometrical or performance characteristic, with another design criterion.


Find Patent Forward Citations

Loading…