The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 21, 2017

Filed:

May. 12, 2016
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Tsuyoshi Ide, Tokyo, JP;

Tetsuro Morimura, Tokyo, JP;

Bin Tong, Fukuoka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/18 (2006.01); G06K 9/00 (2006.01); G06K 9/62 (2006.01); G01B 21/30 (2006.01);
U.S. Cl.
CPC ...
G06F 17/18 (2013.01); G01B 21/30 (2013.01); G06K 9/00536 (2013.01); G06K 9/6267 (2013.01); G06K 9/6284 (2013.01); G06K 9/6298 (2013.01);
Abstract

A method providing an analytical technique introducing label information into an anomaly detection model. The method includes the steps of: inputting measurement data having an anomalous or normal label and measurement data having no label as samples; determining a similarity matrix indicating the relationship between the samples based on the samples; defining a penalty based on the similarity matrix and calculating parameters in accordance with an updating equation having a term reducing the penalty; and calculating a degree of anomaly based on the calculated parameters. The present invention also provides a program and system for detecting an anomaly based on measurement data.


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