The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 21, 2017
Filed:
Jan. 07, 2015
Tongcang LI, West Lafayette, IN (US);
Sadao Ota, Tokyo, JP;
Jeongmin Kim, Berkeley, CA (US);
Yuan Wang, Albany, CA (US);
Xiang Zhang, Alamo, CA (US);
Tongcang Li, West Lafayette, IN (US);
Sadao Ota, Tokyo, JP;
Jeongmin Kim, Berkeley, CA (US);
Yuan Wang, Albany, CA (US);
Xiang Zhang, Alamo, CA (US);
The Regents of the University of California, Oakland, CA (US);
Abstract
This disclosure provides systems, methods, and apparatus related to optical microscopy. In one aspect, an apparatus includes a sample holder, a first objective lens, a plurality of optical components, a second objective lens, and a mirror. The apparatus may directly image a cross-section of a sample oblique to or parallel to the optical axis of the first objective lens, without scanning.