The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 21, 2017
Filed:
Jan. 06, 2014
Applicant:
Rapiscan Systems, Inc., Torrance, CA (US);
Inventor:
Gerard Andrew Hanley, San Diego, CA (US);
Assignee:
Rapiscan Systems, Inc., Torrance, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 5/00 (2006.01);
U.S. Cl.
CPC ...
G01V 5/0041 (2013.01);
Abstract
The present specification describes a scanning/inspection system configured as a dual-view system using dual-energy sensitive stacked detectors that are partially populated with multi-energy discriminating detectors for overall enhanced energy resolution and therefore improved discrimination of materials through better estimation of material physical properties such as density and effective atomic number.